In Circuit Test

In Circuit Test (ICT) is an electrical test which quickly processes boards at high speed to determine if the board was manufactured properly. ICT verifies that all required components are on the board and correctly installed, delivering an easy-to-understand test printout which directs test operators to the exact point of failure. Another common feature is to add functional tests in your ICT fixture – thus increasing the amount of up-front coverage. LED testing, Analog to Digital and Digital to Analog Converter testing, and other features are becoming increasingly popular.


In Circuit Test Capabilities

ICT is a test methodology utilizing electrical probe tests on an assembly. ICT typically goes after manufacturing errors by measuring shorts, opens, capacitance, and resistance. However, advancements in technology have allowed us to enhance ICT testing by adding a component of functional testing. Recent advances have allowed us to incorporate additional functional and embedded tests into these ICT applications, thus allowing for earlier diagnostics in the manufacturing cycle.

Software Development
Fixture Development
In-Circuit Testing
Advanced Boundary Scan Development
Engineering Change Order (ECO)
Local & Offshore Installations
Experience in working with high node count and complexity
In Circuit Test Platforms
60464-Agilent_Medalist_i3070-series_5
Keysight (Agilent) Series II, III, & 5 3070

An industry recognized pioneer in the ICT arena, the 3070 has evolved over 20 years to provide one of the most sophisticated in-circuit test systems available today.

Features OverviewItems Needed to QuoteRequest a QuoteAdditional Resources
Features Overview
Maximum Nodes: 5184
ICT Boundary Scan
Cover-Extend
Flash Device Programming
Flash ISP
Shorts and Opens
Resistors/Capacitors/Inductors
Inductors/Potentiometers
Diodes/Zeners/Transistors
Fuses, Switches, and Jumpers
Items Needed to Quote
CAD Data (Ex. .cad, .brd, .odb++, .pcb, .zip)
Bill of Materials (in Excel Format)
Schematics (.pdf format)
Fab & Assembly Drawings (optional)
Request a Quote

Your Name (required)

Your Email (required)

Telephone (required)

Service

Comments

captcha

Additional Resources
Agilent Medalist i3070 Series 5 [Data Sheet]
IEEE 1149.6 Standard Boundary Scan Testing on Agilent In Circuit Test Systems [White Paper]
Combining Additional Test Features with ICT using Agilent i3070 Series 5 Technology [Case Study]
teststationlx
Teradyne TSLX with GenRad Compatibility

The TestStation LX is Teradyne’s highest capacity in-circuit test solution. It can be configured with a variety of multiplexed and non-multiplexed pin cards and can be used in both low and high pin count applications from 3840 to 7680 pins. The TestStation LX system allows direct transfer of legacy GR228X and TestStation test programs and fixtures, preserving your test investments and providing maximum manufacturing test flexibility.

Features OverviewItems Needed to QuoteRequest a QuoteAdditional Resources
Features Overview
Maximum Nodes: 7680
ICT Boundary Scan
Allows direct transfer from 228X to LX
Flash Device Programming
Flash ISP
Shorts and Opens
Resistors/Capacitors/Inductors
Inductors/Potentiometers
Diodes/Zeners/Transistors
Fuses, Switches, and Jumpers
Items Needed to Quote
CAD Data (Ex. .cad, .brd, .odb++, .pcb, .zip)
Bill of Materials (in Excel Format)
Schematics (.pdf format)
Fab & Assembly Drawings (optional)
Request a Quote

Your Name (required)

Your Email (required)

Telephone (required)

Service

Comments

captcha

Additional Resources
Teradyne TestStation LX In-Circuit Test System [Data Sheet]
Teradyne TestStation LX Fault Coverage Comparison Notes for High Net Count Application [Case Study]
Integrating Corelis ScanExpress Boundary Scan Tests with TestStation Test Programs [Case Study]