Boundary Scan (also known as JTAG) is a very fast, cost-effective way to test new products prior to launch without the need for expensive hardware/fixturing. It easily verifies that processor-based prototypes and beta test boards power up correctly. Other common test methodologies, such as flying probe, do not power up the board and
therefore Manufacturing Managers are electing to use boundary scan in conjunction or in some cases as an alternative to flying probe. Additional return on investment is realized as this application can be used as an RMA debug tool, especially when removing heatsinks is inconvenient in order to place back on a test fixture.
Boundary Scan Capabilities
Boundary Scan test architecture enables the testing of interconnects between integrated circuits on an assembly without using physical test probes. By allowing direct access to nets, Boundary Scan eliminates the need for a large number of test vectors, which are normally needed to properly initialize sequential logic. This provides shorter test times, higher test coverage, and increased diagnostic capability while lowering overall cost of test.
Boundary Scan DFT Reports
Solution Sources takes the time to provide a DFT Report with our Benchtop Boundary Scan solutions. We empower you with the ability to know what will be tested on your assembly prior to developing your application.